Aberration-Corrected Analytical Transmission Electron Microscopy - 9780470518519
Un libro in lingua di Brydson Rik (EDT) edito da John Wiley & Sons Inc, 2011
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Drawn from research surrounding four post-graduate summer schools sponsored by a consortium of leading electron microscopy programs at UK universities, this collection of nine articles provides an overview of the current state of the art in scanning transmission electron microscopy (STEM) and interesting breakthroughs in aberration correction that have led to new cutting edge uses for this venerable technology. Beginning with an overview of transmission electron microscopy principles, topics discussed include electron optics, the development of STEM, aberration diagnosis and correction, simulations of STEM imaging, advanced STEM, electron energy loss spectrometry, applications of aberration corrected scanning and aberration-corrected imaging with CTEM. The work includes numerous illustrations as well as several color plates. The contributors are academics and researchers in materials science and electron microscopy from several leading UK universities. Annotation ©2011 Book News, Inc., Portland, OR (booknews.com)
Informazioni bibliografiche
- Titolo del Libro in lingua: Aberration-Corrected Analytical Transmission Electron Microscopy
- Lingua: English
- Autore: Brydson Rik (EDT)
- Editore: John Wiley & Sons Inc
- Collana: John Wiley & Sons Inc (Hardcover)
- Data di Pubblicazione: 29 Novembre '11
- Genere: SCIENCE
- Argomenti : Transmission electron microscopy Aberration Achromatism
- Pagine: 280
- ISBN-10: 0470518510
- EAN-13: 9780470518519