Advances in Imaging and Electron Physics: Silicon-Based Millimeter-Wave Technology Measurement, Modeling and Applications - 9780123942982

Name: Advances in Imaging and Electron Physics: Silicon-Based Millimeter-Wave Technology Measurement, Modeling and Applications
Brand: Academic Pr
Price: 260.30 EUR
Author: Deen M. Jamal (EDT)
ISBN: 9780123942982

Un libro in lingua di Deen M. Jamal (EDT) edito da Academic Pr, 2012

€ 260.30
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Advances in Imaging and Electron Physics: Silicon-Based Millimeter-Wave Technology Measurement, Modeling and Applications libro in lingua di Deen M. Jamal (EDT)

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Informazioni bibliografiche

Titolo del Libro in lingua: Advances in Imaging and Electron Physics: Silicon-Based Millimeter-Wave Technology Measurement, Modeling and Applications
Lingua: English
Autore: Deen M. Jamal (EDT)
Editore: Academic Pr
Data di Pubblicazione: 27 Novembre '12
Genere: COMPUTERS
EAN-13: 9780123942982