Oxide Reliability - 9789810248420
Un libro in lingua di Dumin D. J. (EDT) edito da World Scientific Pub Co Inc, 2002
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Industry experts provide an overview of the mature topic of oxide reliability, which concerns bias-temperature stability, uniformity, interface properties, leakage currents, endurance, and the use of ever-thinner oxides. Dumin (Clemson U.) edits five in-depth chapters from international authors covering oxide wear-out and breakdown; oxide degradation mechanisms as they apply to cell programming, cell erasing, and data retention; how knowledge of physics of the Si-O-Si system can be used to understand field acceleration parameters of oxide breakdown; statistical and physical modeling, and relationships between soft and hard breakdown; and an anode hole injection model. Annotation (c) Book News, Inc., Portland, OR (booknews.com)
Informazioni bibliografiche
- Titolo del Libro in lingua: Oxide Reliability
- Sottotitolo: A Summary of Silicon Oxide Wearout, Breadown, and Reliability
- Lingua: English
- Autore: Dumin D. J. (EDT)
- Editore: World Scientific Pub Co Inc
- Collana: World Scientific Pub Co Inc (Hardcover)
- Data di Pubblicazione: 01 Aprile '02
- Genere: TECHNOLOGY and ENGINEERING
- Argomenti : Metal oxide semiconductors Reliability Silicon oxide Deterioration
- Pagine: 270
- Dimensioni mm: 247 x 165 x 19
- ISBN-10: 9810248423
- EAN-13: 9789810248420