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Diagnostic Measurements in Lsi/Vlsi Integrated Circuits Production - 9789810202828

Un libro in lingua di Andrzej Jakubowski Wieslaw Marciniak Przewlocki Henryk M. Przewocki Henryk M. edito da World Scientific Pub Co Inc, 1990

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Describes the means to improve the technology of LSI/VLSI IC production, concentrating on improvement of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. Presents a systematic problem-solving approach and describes the main groups of defects found in IC chips. Annotation copyright Book News, Inc. Portland, Or.

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